Scanning tunnelling microscopy of suspended graphene

被引：70

作者：

Zan, Recep ^{[1
,2
]}

Muryn, Chris ^{[3
]}

Bangert, Ursel ^{[2
]}

Mattocks, Philip ^{[4
]}

Wincott, Paul ^{[5
]}

Vaughan, David ^{[5
]}

Li, Xuesong ^{[6
,7
,8
]}

Colombo, Luigi ^{[9
]}

Ruoff, Rodney S. ^{[6
,7
]}

Hamilton, Bruce ^{[4
]}

Novoselov, Konstantin S. ^{[1
]}

机构：

[1] Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England

[2] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England

[3] Univ Manchester, Sch Chem, Manchester M13 9PL, Lancs, England

[4] Univ Manchester, Photon Sci Inst, Manchester M13 9PL, Lancs, England

[5] Univ Manchester, Sch Earth Atmospher & Environm Sci, Manchester M13 9PL, Lancs, England

[6] Univ Texas Austin, Dept Mech Engn, Austin, TX 78712 USA

[7] Univ Texas Austin, Mat Sci & Engn Program, Austin, TX 78712 USA

[8] IBM Corp, TJ Watson Res Ctr, Yorktown Hts, NY USA

[9] Texas Instruments Inc, Dallas, TX 75243 USA

来源：

NANOSCALE | 2012年 / 4卷 / 10期

基金：

英国工程与自然科学研究理事会;

关键词：

LARGE-AREA; FILMS;

D O I：

10.1039/c2nr30162h

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Suspended graphene has been studied by STM for the first time. Atomic resolution on mono- and bi-layer graphene samples has been obtained after ridding the graphene surface of contamination via high-temperature annealing. Static local corrugations (ripples) have been observed on both types of structures.

引用

页码：3065 / 3068

页数：4

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