A bent silicon crystal in the Laue geometry to resolve actinide x-ray fluorescence for x-ray absorption spectroscopy

被引：0
|
作者：
Kropf, A. J. [1 ]
Fortner, J. A. [1 ]
Finch, R. J. [1 ]
Cunnane, J. C. [1 ]
Karanfil, C. [2 ]
机构：
[1] Argonne Natl Lab, Div Chem Engn, Argonne, IL 60439 USA
[2] IIT, Chicago, IL 60616 USA
来源：
PHYSICA SCRIPTA | 2005年 / T115卷
关键词：
D O I：
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中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A highly strained, curved silicon crystal in the Laue geometry has been used as a large area X-ray fluorescence analyzer for X-ray absorption spectroscopy. The analyzer is able to resolve the L alpha fluorescence lines for neighboring actinide elements. A large gain in the signal-to-background ratio has been achieved for low levels of Mo, Np, and Pu in a UO2 matrix. We have determined the chemical state of these elements in approved testing materials of uranium oxide spent nuclear fuel. Due to inelastic scattering from the predominant uranium, the concentration of Np measured, 0.6(2) mg Np/gram U, may be approaching the sensitivity limits for quantitative structural spectroscopy measurements.
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页码：998 / 1000
页数：3
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