Size-dependent thermal instability and melting behavior of Sn nanowires

被引:74
|
作者
Shin, Ho Sun
Yu, Jin
Song, Jae Yong [1 ]
机构
[1] Korea Res Inst Stand & Sci, Div Adv Technol, Taejon 305600, South Korea
[2] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Ctr Elect Packaging Mat, Taejon 305701, South Korea
基金
欧洲研究理事会;
关键词
D O I
10.1063/1.2801520
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thermal instability and melting behavior of tin nanowires were studied with a decrease of wire radius (r(NW)= 7-30 nm) via differential scanning calorimetry (DSC). Two sequential DSC measurements showed a 1/r(NW) dependency of the melting temperature depression; the first melting temperature decreased from 502 to 486 K with 1/r(NW) whereas the second one was more depressed between 0.8 and 5 K. The melting temperature difference between the first and second cycles increased linearly with 1/r(NW). This variation was attributed to fragmentation of nanowires due to Rayleigh instability. Here, fragmentation of long nanowires was suppressed by a template confinement, resulting in the formation of short nanorods. (C) 2007 American Institute of Physics.
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页数:3
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