Characterization of platinum-rutheniun electrodeposits using XRD, AES and XPS analysis

被引:36
|
作者
Cattaneo, C
de Pinto, MIS
Mishima, H
de Mishima, BAL
Lescano, D
Cornaglia, L
机构
[1] Univ Nacl Santiago del Estero, FAA, Inst Ciencia Quim, RA-4200 Santiago Del Estero, Argentina
[2] Natl Univ Cordoba, FAMAF, RA-5000 Cordoba, Argentina
[3] Univ Nacl Litoral, Fac Ingn Quim, Santa Fe, Argentina
来源
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1999年 / 461卷 / 1-2期
关键词
Pt-Ru electrodeposits; X-ray diffraction; AES; XPS;
D O I
10.1016/S0022-0728(98)00196-X
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Metallic deposits of platinum-ruthenium were produced on a gold substrate by electrodeposition from salts in platinum and ruthenium solutions. These deposits were characterized by X-ray diffraction, Auger electron spectroscopy and X-ray photoelectron spectroscopy. The XRD studies showed a crystalline alloy whose structure was cubic centered on the face; that is, an alloy of one phase as a substitutional solid solution where the platinum atoms were replaced by ruthenium atoms. Some deposits grew with the crystals oriented according to a preferential direction and developed a crystallographic texture. The XPS analysis revealed that, in principle, there are no compounds with oxidation states different from metal ruthenium and metal platinum. Good correlations were obtained between the values of the ratios in atomic composition of Pt-Ru for the different samples calculated for XPS and Auger spectroscopy. The catalytic activity of the electrodeposits was measured in methanol solutions. From the XRD studies, the network parameters and the crystallographic texture were compared before and after using them in electrochemical methanol oxidation, The distribution of the observed relative integrated intensities of the diffraction patterns of the deposits showed a variation which is more evident when the deposit has a preferential grain orientation. The reflective power of planes (111) decreases after methanol oxidation. (C) 1999 Published by Elsevier Science S.A. All rights reserved.
引用
收藏
页码:32 / 39
页数:8
相关论文
共 50 条
  • [11] Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS
    A. John
    Hans-Joachim Scheibe
    Holger Ziegele
    Steffen Oswald
    Fresenius' Journal of Analytical Chemistry, 1997, 358 : 304 - 307
  • [12] Characterization of laser-arc deposited multilayer systems by means of AES, factor analysis and XPS
    John, A
    Scheibe, HJ
    Ziegele, H
    Oswald, S
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1997, 358 (1-2): : 304 - 307
  • [13] Structural Characterization of Ni-Substituted Hexaaluminate Catalysts Using EXAFS, XANES, XPS, XRD, and TPR
    Gardner, Todd H.
    Spivey, James J.
    Kugler, Edwin L.
    Campos, Andrew
    Hissam, Jason C.
    Roy, Amitava D.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (17): : 7888 - 7894
  • [14] MICROSPOT CHEMICAL-ANALYSIS USING COMBINED HIGH-RESOLUTION AES AND XPS
    STAIB, P
    DERUGY, H
    CONTOUR, JP
    MASSIES, J
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1987, 329 (2-3): : 201 - 201
  • [15] Combined spectral analysis (EDXRF, ICP-AES, XRD, FTIR) for characterization of bronze Roman Mirror
    Ion, Rodica-Mariana
    Boros, Doina
    Ion, Mihaela-Lucia
    Dumitriu, Irina
    Radu-Claudiu, Fierascu
    Constantin, Radovici
    Florea, Gina
    Bercu, Cristiana
    METALURGIA INTERNATIONAL, 2008, 13 (05): : 61 - 65
  • [16] Characterization Studies of Non-Stick On Pad (NSOP) Using AES, XPS and TOF-SIMS
    Hua Younan
    Chen Yixin
    Shao Jingjing
    Hao Meng
    Shen Yue
    Xing Zhenxiang
    Feng Yang
    Fu Chao
    Li Xiaomin
    2014 IEEE 36TH INTERNATIONAL ELECTRONICS MANUFACTURING TECHNOLOGY CONFERENCE (IEMT), 2015,
  • [17] Spectroscopy characterization of acid and rennet camel milk caseins using XRD, XPS, and SEM and evaluation of their emulsifying properties
    Bensalah, Bachir
    Acem, Kamel
    MLJEKARSTVO, 2022, 72 (03): : 161 - 171
  • [18] Analyzing the chemical environment of bent bamboo (Phyllostachys iridescens) sections using XRD, XPS, and FTIR analysis
    Wang, Xuehua
    Lin, Zhixin
    Shi, Mengxue
    Zhou, Yuyan
    Xu, Wei
    WOOD MATERIAL SCIENCE & ENGINEERING, 2024,
  • [19] Study of structural and surface morphological properties of Tb doped ZnO nanoparticles using XRD, XPS and fractal analysis
    Kumar, Anil
    Sharma, A.
    Bhasker, Savita
    Yadav, R. P.
    Bhasker, H. P.
    Priya, P. K.
    Pandey, K. L.
    Mandal, Satish Kumar
    Anand, R. K.
    MATERIALS RESEARCH EXPRESS, 2019, 6 (11):
  • [20] ANALYSIS OF SURFACES USING THE XPS, AES, SIMS METHODS IN THE LHS-10 LEYBOLD-HERAEUS SYSTEM
    WECHSUNG, R
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1983, 38 (217): : 309 - 331