共 50 条
- [1] Characterization of platinum-ruthenium electrodeposits using XRD, AES and XPS analysis J Electroanal Chem, 1-2 (32-39):
- [4] Characterization of capped multilayer mirrors using XPS, AES and SIMS Emerging Lithographic Technologies IX, Pts 1 and 2, 2005, 5751 : 1084 - 1091
- [6] CHARACTERIZATION OF NANOPOROUS CERAMIC MATERIALS USING COMBINED XRD, XPS AND PAL SPECTROSCOPY BIOPHOTONICS: SPECTROSCOPY, IMAGING, SENSING, AND MANIPULATION, 2011, : 397 - 397
- [7] ANALYSIS OF CORROSION LAYERS ON ELECTRODEPOSITED ZN-NI (13WT-PERCENT) ALLOYS USING AES, SAM, XPS, SEM AND XRD TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 72 (11): : 1782 - 1789
- [9] Characterization using XPS and XRD of Ti(C,N) coating properties for cutting tool applications InterCeram: Int. Ceram. Rev., 6 (287-290):
- [10] Analysis of "Gadhi Soil" using XRD and electrical characterization PROTECTION OF HISTORICAL BUILDINGS - PROHITECH 09, VOL 1 AND 2, 2009, : 1629 - +