Terahertz responsivity of AlGaN/GaN bow-tie diode detectors at the temperatures of 295 K and 80 K

被引:1
|
作者
Jorudas, J. [1 ]
Kasalynas, I [1 ]
机构
[1] Ctr Phys Sci & Technol FTMC, Sauletekio Ave 3, LT-10257 Vilnius, Lithuania
关键词
D O I
10.1109/IRMMW-THz50927.2022.9895472
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
terahertz (THz) responsivity of the planar bow-tie (BT) diodes based on AlGaN/GaN high electron mobility transistor (HEMT) structures were investigated at the temperatures of 295 K and 80 K in the frequency range of 150-600 GHz. At 295 K, the zero-bias responsivity of the BT diode was found to be of about 72 mV/W. Biasing the detector by +/- 1 V allowed us to increase the responsivity by at least 50 times, while cooling the detectors down to 80 K demonstrated the increase by up to 20 times independently on the frequency of THz beam.
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