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Sequence-controlled molecular layers on surfaces by thiol-ene chemistry: synthesis and multitechnique characterization
被引:1
|作者:
Llevot, A.
[1
]
Steinmueller, S. O.
[2
]
Bitterer, B.
[1
]
Ridder, B.
[1
]
Berson, J.
[3
,4
]
Walheim, S.
[3
,4
]
Schimmel, T.
[3
,4
]
Braese, S.
[1
,5
]
Scheiba, F.
[2
]
Meier, M. A. R.
[1
]
机构:
[1] Karlsruhe Inst Technol, Mat Wissensch Zentrum MZE, Inst Organ Chem, Bldg 30-48 Str Forum 7, D-76131 Karlsruhe, Germany
[2] Karlsruhe Inst Technol, Inst Appl Mat, Hermann von Helmholtz Pl 1, D-76344 Eggenstein Leopoldshafen, Germany
[3] Karlsruhe Inst Technol, Inst Appl Phys, Wolfgang Gaede Str 1, D-76131 Karlsruhe, Germany
[4] Inst Nanotechnol INT, Hermann von Helmholtz Pl 1, D-76344 Eggenstein Leopoldshafen, Germany
[5] Karlsruhe Inst Technol, Inst Toxicol & Genet, Hermann von Helmholtz Pl 1, D-76344 Eggenstein Leopoldshafen, Germany
关键词:
SELF-ASSEMBLED MONOLAYERS;
ION MASS-SPECTROMETRY;
BY-LAYER;
CLICK CHEMISTRY;
ULTRATHIN FILMS;
CHEMICAL DERIVATIZATION;
MULTILAYER FILMS;
TOF-SIMS;
DEPOSITION;
XPS;
D O I:
10.1039/c7py01515a
中图分类号:
O63 [高分子化学(高聚物)];
学科分类号:
070305 ;
080501 ;
081704 ;
摘要:
Silicon surfaces were functionalized by thiol-ene chemistry using sequential reactions of different alpha,omega-dienes and alpha,omega-dithiols bearing marker moieties. A system of six individual layers was achieved and exhaustively characterized by combining independent techniques such as X-ray Photoelectron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry and Atomic Force Microscopy using a molecular ruler system.
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页码:5824 / 5828
页数:5
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