Understanding common-mode noise on wide data-buses

被引：1

作者：

Deutsch, A ^{[1
]}

Smith, HH ^{[1
]}

Kopesay, GV ^{[1
]}

Krauter, BL ^{[1
]}

Surovic, CW ^{[1
]}

Elfadel, A ^{[1
]}

Widiger, DJ ^{[1
]}

机构：

[1] IBM Corp, Thomas J Watson Res Ctr, Div Res, Yorktown Hts, NY 10598 USA

来源：

ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING | 2003年

关键词：

D O I：

10.1109/EPEP.2003.1250056

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(f)L(f)C behavior of the reference series impedance.

引用

页码：309 / 312

页数：4

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