Understanding common-mode noise on wide data-buses

被引：1
|
作者：
Deutsch, A [1 ]
Smith, HH [1 ]
Kopesay, GV [1 ]
Krauter, BL [1 ]
Surovic, CW [1 ]
Elfadel, A [1 ]
Widiger, DJ [1 ]
机构：
[1] IBM Corp, Thomas J Watson Res Ctr, Div Res, Yorktown Hts, NY 10598 USA
来源：
ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING | 2003年
关键词：
D O I：
10.1109/EPEP.2003.1250056
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(f)L(f)C behavior of the reference series impedance.
引用
收藏
页码：309 / 312
页数：4
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