Real-time current testing for A/D converters

被引：10
|
作者：
Miura, Y
机构：
[1] IEEE, IEEE Computer Society, Inst. Electronics, Info.
[2] Dept. of Electronics and Info. Eng., Tokyo Metropolitan University, Hachioji, Tokyo 192-03
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1996年 / 13卷 / 02期
关键词：
D O I：
10.1109/54.500199
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The author has revised current testing For analog circuits, examined his method for effective fault detection, and applied it to an A/D converter. This method measures the integral of the power supply current during one clock period in which a test vector is applied. Simulation results show effective detection of target faults in the CUT when applying a step voltage input and easier detection when applying a higher power supply voltage.
引用
收藏
页码：34 / 41
页数：8
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