Construction of refractive-index profiles of graded-index planar waveguides from effective indexes measured with different mode types and external refractive indexes

被引：1
|
作者：
Wei, J [1 ]
Xu, XF [1 ]
Kang, ZH [1 ]
Jiang, Y [1 ]
Ding, Y [1 ]
Gao, JY [1 ]
机构：
[1] Jilin Univ, Coll Phys, Key Lab Coherent Light, Atom & Mol Spect Educ Minist, Changchun 130023, Peoples R China
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2005年 / 45卷 / 04期
关键词：
refractive-index profile (RIP); graded-index planar waveguides; inverse Wentzel-Krainer-Brillouin (IWKB) approximation;
D O I：
10.1002/mop.20818
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method is presented whereby the refractive-index profile (RIP) can be reconstructed from sets of effective indexes measured with different mode types and external refractive indexes. Single-mode waveguide RIP characterization can be easily realized using an index-matching liquid at a single wavelength. This method is described and demonstrated via numerical examples and experimental results. The method has the advantages of convenient operation and accurate results for the characterization of graded-index planar waveguides that support both mode types and contain known modal birefringence. (c) 2005 Wiley Periodicals, Inc.
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页码：342 / 345
页数：4
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