Observation of Band Gap in Epitaxial Bilayer Graphene Field Effect Transistors

被引:17
|
作者
Tanabe, Shinichi [1 ]
Sekine, Yoshiaki [1 ]
Kageshima, Hiroyuki [1 ]
Nagase, Masao [1 ]
Hibino, Hiroki [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan
关键词
ELECTRIC-FIELD;
D O I
10.1143/JJAP.50.04DN04
中图分类号
O59 [应用物理学];
学科分类号
摘要
Bilayer graphene was grown on the Si-face of SiC by thermal decomposition. Its electronic properties were investigated in top-gate Hall bar devices. By controlling the carrier density using gate voltage, we were able to access the charge neutrality point. The conductance at the charge neutrality point showed a strong temperature dependence, and its temperature dependence was well fitted with thermal activation and variable-range hopping mechanisms. The electrical detection of a band gap opening in bilayer graphene grown on SiC is a promising step toward the realization of graphene-based electronics using epitaxial graphene. (C) 2011 The Japan Society of Applied Physics
引用
收藏
页数:4
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