Research on Accelerated Durability Test of Photovoltaic Hollow Modules

被引：0

作者：

Wang, Dong ^{[1
]}

Wang, Li ^{[1
]}

机构：

[1] China Bldg Mat Test & Certificat Grp Co Ltd, 1 Guanzhuang DongLi, Beijing 100024, Peoples R China

来源：

GLOBAL INTELLIGENCE INDUSTRY CONFERENCE (GIIC 2018) | 2018年 / 10835卷

基金：

国家高技术研究发展计划(863计划);

关键词：

photovoltaic hollow modules; high temperature and humidity; durability; molecular sieve;

D O I：

10.1117/12.2505338

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

The durability of photovoltaic hollow glass modules for buildings is an important index. In accordance with the Chinese national standard of the hollow glass (GB/T11944-2012) and referring to the international standard (IEC61215:2005) on test method for PV module in simulated environments, we have designed and conducted an accelerated durability test of photovoltaic hollow glass modules. Based on analysis of the test results, the paper puts forward several critical technical points that should be noticed in the testing process, and points out the failure modes and its mechanism, and would thus help to improve the reliability and durability of photovoltaic hollow modules.

引用

页数：6

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