On the theory of x-ray diffractional laue focusing on two bent crystals

The Laue focusing of a spherical x-ray wave onto dynamical diffraction by a double-bent crystal system is studied. The geometrical equations of two-dimensional Laue focusing and the intensity distribution formula are derived. A high sensitivity of the two-dimensional Laue focusing to the crystal thickness and bending radii difference is revealed. It is shown that this sensitivity can be used to control the crystal thickness with accuracy up to 100 Angstrom and bending radii Up to similar to10(-2) m. The focusing process of the spherical wave inside crystals as well as in vacuum is investigated. The possibility of using the two-crystal Laue system as a lens for x-ray microscopy is studied. The spectral characteristics of a twice-diffracted wave are discussed. The spectral resolution is demonstrated to be 10(6).