Redundancy revisited

被引：0
|
作者：
Savir, J [1 ]
机构：
[1] New Jersey Inst Technol, ECE Dept, Newark, NJ 07102 USA
来源：
WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2 | 1998年
关键词：
D O I：
暂无
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
This paper shows that when it comes to CMOS designs undetectability does not necessarily imply redundancy. The definition of redundancy is extended to account for the special behavior encountered in CMOS designs. The accuracy of the new redundancy definition has been tested on several CMOS chips and has been found to be correct.
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页码：407 / 412
页数：6
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