On recent developments for high-speed atomic force microscopy

被引：0

作者：

Schitter, G ^{[1
]}

Fantner, GE ^{[1
]}

Kindt, JH ^{[1
]}

Thurner, PJ ^{[1
]}

Hansma, PK ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA

来源：

2005 IEEE/ASME INTERNATIONAL CONFERENCE ON ADVANCED INTELLIGENT MECHATRONICS, VOLS 1 AND 2 | 2005年

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

The atomic force microscope (AFM) is limited in imaging speed by the bandwidth and dynamic behavior of the actuators and mechanical parts. For high-speed imaging all AFM components have to be optimized in performance. Here, we present improvements of the force sensor, the scanner, the controller, and the data acquisition system. By combining all these improvements, the next generation AFMs will enable imaging speeds more than two orders of magnitude faster than current commercial AFM systems.

引用

页码：261 / 264

页数：4

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