The impact of context metrics on just-in-time defect prediction

被引:42
|
作者
Kondo, Masanari [1 ]
German, Daniel M. [2 ]
Mizuno, Osamu [1 ]
Choi, Eun-Hye [3 ]
机构
[1] Kyoto Inst Technol, Software Engn Lab, Kyoto, Japan
[2] Univ Victoria, Dept Comp Sci, Victoria, BC, Canada
[3] Informat Technol Res Inst, Natl Inst Adv Ind Sci, Technol, Sapporo, Japan
基金
加拿大自然科学与工程研究理事会; 日本学术振兴会;
关键词
Just-in-time defect prediction; Defect prediction; Source code changes; Context lines; Changed lines; Indentation metrics; Code churn metrics; SOFTWARE CHANGES; CODE CHURN; COMPLEXITY; FAULTS;
D O I
10.1007/s10664-019-09736-3
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Traditional just-in-time defect prediction approaches have been using changed lines of software to predict defective-changes in software development. However, they disregard information around the changed lines. Our main hypothesis is that such information has an impact on the likelihood that the change is defective. To take advantage of this information in defect prediction, we consider n-lines (n = 1,2, horizontal ellipsis ) that precede and follow the changed lines (which we call context lines), and propose metrics that measure them, which we call "Context Metrics." Specifically, these context metrics are defined as the number of words/keywords in the context lines. In a large-scale empirical study using six open source software projects, we compare the performance of using our context metrics, traditional code churn metrics (e.g., the number of modified subsystems), our extended context metrics which measure not only context lines but also changed lines, and combination metrics that use two extended context metrics at a prediction model for defect prediction. The results show that context metrics that consider the context lines of added-lines achieve the best median value in all cases in terms of a statistical test. Moreover, using few number of context lines is suitable for context metric that considers words, and using more number of context lines is suitable for context metric that considers keywords. Finally, the combination metrics of two extended context metrics significantly outperform all studied metrics in all studied projects w. r. t. the area under the receiver operation characteristic curve (AUC) and Matthews correlation coefficient (MCC).
引用
收藏
页码:890 / 939
页数:50
相关论文
共 50 条
  • [31] Local versus Global Models for Just-In-Time Software Defect Prediction
    Yang, Xingguang
    Yu, Huiqun
    Fan, Guisheng
    Shi, Kai
    Chen, Liqiong
    SCIENTIFIC PROGRAMMING, 2019, 2019
  • [32] Deep Just-In-Time Defect Localization
    Qiu, Fangcheng
    Gao, Zhipeng
    Xia, Xin
    Lo, David
    Grundy, John
    Wang, Xinyu
    IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2022, 48 (12) : 5068 - 5086
  • [33] Cross-Project Online Just-In-Time Software Defect Prediction
    Tabassum, Sadia
    Minku, Leandro L.
    Feng, Danyi
    IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2023, 49 (01) : 268 - 287
  • [34] Just-in-time defect prediction for mobile applications: using shallow or deep learning?
    Raymon van Dinter
    Cagatay Catal
    Görkem Giray
    Bedir Tekinerdogan
    Software Quality Journal, 2023, 31 : 1281 - 1302
  • [35] Studying just-in-time defect prediction using cross-project models
    Yasutaka Kamei
    Takafumi Fukushima
    Shane McIntosh
    Kazuhiro Yamashita
    Naoyasu Ubayashi
    Ahmed E. Hassan
    Empirical Software Engineering, 2016, 21 : 2072 - 2106
  • [36] A Practical Human Labeling Method for Online Just-in-Time Software Defect Prediction
    Song, Liyan
    Minku, Leandro Lei
    Teng, Cong
    Yao, Xin
    PROCEEDINGS OF THE 31ST ACM JOINT MEETING EUROPEAN SOFTWARE ENGINEERING CONFERENCE AND SYMPOSIUM ON THE FOUNDATIONS OF SOFTWARE ENGINEERING, ESEC/FSE 2023, 2023, : 605 - 617
  • [37] Just-in-time defect prediction for mobile applications: using shallow or deep learning?
    van Dinter, Raymon
    Catal, Cagatay
    Giray, Goerkem
    Tekinerdogan, Bedir
    SOFTWARE QUALITY JOURNAL, 2023, 31 (04) : 1281 - 1302
  • [38] Class Imbalance Evolution and Verification Latency in Just-in-Time Software Defect Prediction
    Cabral, George G.
    Minku, Leandro L.
    Shihab, Emad
    Mujahid, Suhaib
    2019 IEEE/ACM 41ST INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE 2019), 2019, : 666 - 676
  • [39] Just-in-time software defect prediction using deep temporal convolutional networks
    Ardimento, Pasquale
    Aversano, Lerina
    Bernardi, Mario Luca
    Cimitile, Marta
    Iammarino, Martina
    NEURAL COMPUTING & APPLICATIONS, 2022, 34 (05): : 3981 - 4001
  • [40] Effort-Aware semi-Supervised just-in-Time defect prediction
    Li, Weiwei
    Zhang, Wenzhou
    Jia, Xiuyi
    Huang, Zhiqiu
    INFORMATION AND SOFTWARE TECHNOLOGY, 2020, 126