Quantum electron conductance of four-terminal junctions

被引：0

作者：

Lu, Jian-Duo ^{[1
]}

Hou, Yang-Lai ^{[1
]}

Dai, Hou-Mei ^{[1
]}

Hou, Ting-Ping ^{[1
]}

机构：

[1] Wuhan Univ Sci & Technol, Dept Appl Phys, Wuhan 430081, Peoples R China

来源：

INTERNATIONAL JOURNAL OF MODERN PHYSICS B | 2008年 / 22卷 / 13期

关键词：

quantum interference; bend resistance; scattering-matrix method;

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

With the help of the scattering-matrix method, the quantum states of ballistic electrons and conductance, as well as resistance are studied in a four-terminal junction of narrow wire with various widths. We find that these observable quantities are highly sensitive to the geometries of junctions and differ from the conventional structure with the same width. In particular, the predicted quantization conductance phenomena are striking and are also in self-consistency with calculated scattering probabilities, relating to electronic subbands and transmission states.

引用

页码：2100 / 2110

页数：11

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