Gas-to-particle conversion mechanism in chemical vapor deposition of silicon carbide by SiH4 and C2H2

被引:6
|
作者
Hong, LS [1 ]
Liu, ZL [1 ]
机构
[1] Natl Taiwan Univ Sci & Technol, Dept Chem Engn, Taipei 10672, Taiwan
关键词
D O I
10.1021/ie9801812
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
A gas-to-particle conversion mechanism is proposed for producing silicon carbide ultrafine particles by a SiH4/C2H2 chemical vapor deposition reaction system. The reaction was performed in a horizontal hot-wall tubular reactor at a temperature range of 1123-1373 K, where SiC was formed as an aerosol in the gas phase and deposited to form porous SiC films. An analysis of the deposition growth rate profile along the longitudinal direction of the reactor shows that the depositing process is controlled by a gas-phase reaction with an activation of 23 kcal/mol. Also, the composition ratio of carbon to silicon of the deposited films was found to change gradually from 1 at the inlet of the reactor to 2 downstream. The results imply that a gaseous polymerization reaction between C2H2 and SiH2 plays an important role in the formation of the particles.
引用
收藏
页码:3602 / 3609
页数:8
相关论文
共 50 条
  • [21] CHEMICAL-VAPOR-DEPOSITION OF TISI2 USING SIH4 AND TICL4
    MENDICINO, MA
    SOUTHWELL, RP
    SEEBAUER, EG
    THIN SOLID FILMS, 1994, 253 (1-2) : 473 - 478
  • [22] Influence of H2/SiH4 ratio on the deposition rate and morphology of polycrystalline silicon films deposited by atmospheric pressure plasma chemical vapor deposition
    Ohmi, Hiromasa
    Kakiuchi, Hiroaki
    Yasutake, Kiyoshi
    Nakahama, Yasuji
    Ebata, Yusuke
    Yoshii, Kumayasu
    Mori, Yuzo
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (4B): : 3581 - 3586
  • [23] Nanocrystalline cubic silicon carbide films prepared by hot-wire chemical vapor deposition using SiH4/CH4/H2 at a low substrate temperature
    Komura, Y.
    Tabata, A.
    Narita, T.
    Kondo, A.
    Mizutani, T.
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2006, 352 (9-20) : 1367 - 1370
  • [24] SILICON ATOMIC LAYER GROWTH CONTROLLED BY FLASH HEATING IN CHEMICAL-VAPOR DEPOSITION USING SIH4 GAS
    MUROTA, J
    SAKURABA, M
    ONO, S
    APPLIED PHYSICS LETTERS, 1993, 62 (19) : 2353 - 2355
  • [25] SILICON EPITAXIAL-GROWTH AT 300-DEGREES-C BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION FROM SIH4/H2
    CHEN, CH
    WAN, CM
    YEW, TR
    SHIEH, MD
    KUNG, CY
    APPLIED PHYSICS LETTERS, 1993, 62 (24) : 3126 - 3128
  • [26] Influence of SiH2Cl2 on the kinetics of the chemical vapor deposition of tungsten by SiH4 reduction of WF6
    Jongste, JF
    Oosterlaken, TGM
    Janssen, GCAM
    Radelaar, S
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1999, 146 (01) : 167 - 169
  • [27] Lattice kinetic Monte Carlo simulation of epitaxial growth of silicon thin films in H2/SiH4 chemical vapor deposition systems
    Pablo Balbuena, Juan
    Martin-Bragado, Ignacio
    THIN SOLID FILMS, 2017, 634 : 121 - 133
  • [28] DEPOSITION OF DOPED POLYSILICON FILMS BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION FROM ASH3/SIH4 OR B2H6/SIH4 MIXTURES
    HAJJAR, JJJ
    REIF, R
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (09) : 2888 - 2896
  • [29] Deposition rate optimization in SiH4/H2 PECVD of hydrogenated microcrystalline silicon
    Amanatides, E
    Mataras, D
    Rapakoulias, DE
    THIN SOLID FILMS, 2001, 383 (1-2) : 15 - 18
  • [30] PLASMA CHEMISTRY OF HE/O2/SIH4 AND HE/N2O/SIH4 MIXTURES FOR REMOTE PLASMA-ACTIVATED CHEMICAL-VAPOR-DEPOSITION OF SILICON DIOXIDE
    KUSHNER, MJ
    JOURNAL OF APPLIED PHYSICS, 1993, 74 (11) : 6538 - 6553