Active enhanced tunable high-Q on-chip E-band resonators in 130nm SiGe BiCMOS

被引:0
|
作者
Singh, Nishant [1 ]
Stander, Tinus [1 ]
机构
[1] Univ Pretoria, Dept EEC Engn, Carl & Emily Fuchs Inst Microelect, Pretoria, South Africa
关键词
millimeter wave integrated circuits; BiCMOS integrated circuits; Q measurement; heterojunction bipolar transistors; resonators;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A simulation study of a high-Q resonator in a commercial 130nm SiGe BiCMOS process for E-band frequencies is presented. The resonator is a planar quarter-wave microstrip resonator that uses a HBT based negative resistance circuit to counter losses and enhance the unloaded Q-factor. Using 3D EM (FEM) and circuit co-simulation, enhanced unloaded Q-factors of up to 892 are shown at a frequency of 83.5 GHz compared to the unenhanced unloaded Q-factor of 7. The negative resistance circuit sufficiently compensates for low Q-factors of the planar resonator and the varactor. The resonator is also shown to be continuously tunable in frequency from 82 to 84 GHz, and in unloaded Q-factor from 7 to 892, whilst maintaining unconditional stability in all tuning states.
引用
收藏
页码:201 / 204
页数:4
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