Shadow edge lithography for nanoscale patterning and manufacturing

被引:18
|
作者
Bai, John G.
Chang, Cheng-Ling
Chung, Jae-Hyun
Lee, Kyong-Hoon
机构
[1] Univ Washington, Dept Mech Engn, Seattle, WA 98195 USA
[2] NanoFacture Inc, Ann Arbor, MI 48108 USA
关键词
D O I
10.1088/0957-4484/18/40/405307
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We demonstrate a wafer-scale nanofabrication method using the shadow effect in physical vapor deposition. An analytical model is presented to predict the formation of nanoscale gaps created by the shadow effect of a prepatterned edge on a deposition plane. The theoretical prediction agrees quantitatively with the widths of the fabricated nanogaps and nanochannels. In the diffusion experiments, both lambda-DNA and fluorescein molecules were successfully introduced into the nanochannels. The proposed shadow edge lithography has potential to be a candidate for mass-producing nanostructures.
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页数:8
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