On compaction-based concurrent error detection

被引：0
|
作者：
Almukhaizim, S [1 ]
Drineas, P [1 ]
Makris, Y [1 ]
机构：
[1] Yale Univ, Dept Elect Engn, New Haven, CT 06520 USA
来源：
9TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS | 2003年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：157 / 157
页数：1
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