Validating Halstead Metrics for Scratch Program using Process Data

被引：0
|
作者：
Chang, Zhong [1 ]
Song, RongGang [2 ]
Sun, Yan [1 ]
机构：
[1] Beijing Univ Posts & Telecommun, Beijing, Peoples R China
[2] Yiwu Res Inst Educ Sci, Jinhua, Peoples R China
来源：
2018 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS-TAIWAN (ICCE-TW) | 2018年
基金：
中国国家自然科学基金;
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
What will happen when traditional software complexity measures meet latest visual programming language? Are they still valid? In this paper, in order to validate classic Halstead Metrics for Scratch programming language, which is the most used language in K-12 education, we collect process data by modifying the Scratch platform. The results show a positive, significant and strong correlation between process data and Halstead Metrics, could be considered as a validation of Halstead Metrics for Scratch Program.
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页数：2
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