Optical testing by the use of the chromatic split of non-classical localization planes

被引:0
|
作者
Comastri, SA [1 ]
Simon, JM [1 ]
Echarri, R [1 ]
机构
[1] Univ Buenos Aires, Fac Ciencias Exactas & Nat, Dept Fis, Lab Opt, RA-1428 Buenos Aires, DF, Argentina
关键词
D O I
10.1117/12.524169
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
When a spatially incoherent, periodic, quasi-monochromatic source illuminates an amplitude division two beam interferometer verifying the equivalent sine condition, successive non-classical localization planes appear. If the radiation is. polichromatic each plane splits and that corresponding to a given wavelength can be distinctly viewed interposing an adequate filter. Thus interchanging filters and with no other change in the configuration, a non-classical localization plane shifts. In the present paper this shift is employed to examine various transversal planes of a thick transparent specimen with a few phase. disturbances distributed in its volume. Result's obtained with a Wollaston prism are shown.
引用
收藏
页码:172 / 173
页数:2
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