Shifting of localization planes in optical testing: Application to a shearing interferometer

被引：0
|
作者：
Simon, Juan M. [1 ]
Comastri, Silvia A. [1 ,2 ]
Echarri, Rodolfo M. [1 ,2 ]
机构：
[1] Laboratorio de Optica, Fac. de Ciencias Exactas y Naturales, Universidad de Buenos Aires, 1428 Buenos Aires, Argentina
[2] Consejo Nac. de Invest. Cie./Tec., Buenos Aires, Argentina
来源：
Applied Optics | 2001年 / 40卷 / 28期
关键词：
Shearing interferometers;
D O I：
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中图分类号：
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摘要：
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页码：4999 / 5010
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