Dark Current Spectroscopy in Alpha Irradiated CMOS Image Sensors

被引：0
|
作者：
Belloir, Jean-Marc
Goiffon, Vincent
Virmontois, Cedric
Raine, Melanie
Paillet, Philippe
Magnan, Pierre
Gilard, Olivier
机构：
来源：
2015 15TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2015年
关键词：
PROTON; SILICON; TRAPS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页数：4
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