Lateral shearing interferometry of high-harmonic wavefronts

被引：36
|
作者：
Austin, Dane R. [2 ]
Witting, Tobias [1 ,2 ]
Arrell, Christopher A. [1 ]
Frank, Felix [1 ]
Wyatt, Adam S. [2 ]
Marangos, Jon P. [1 ]
Tisch, John W. G. [1 ]
Walmsley, Ian A. [2 ]
机构：
[1] Univ London Imperial Coll Sci Technol & Med, Blackett Lab, Quantum Opt & Laser Sci Grp, London SW7 2BW, England
[2] Univ Oxford, Clarendon Lab, Oxford OX1 3PU, England
来源：
OPTICS LETTERS | 2011年 / 36卷 / 10期
基金：
英国工程与自然科学研究理事会;
关键词：
PULSES; LASER;
D O I：
10.1364/OL.36.001746
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a technique for frequency-resolved wavefront characterization of high harmonics based on lateral shearing interferometry. Tilted replicas of the driving laser pulse are produced by a Mach-Zehnder interferometer, producing separate focii in the target. The interference of the resulting harmonics on a flat-field extreme ultraviolet spectrometer yields the spatial phase derivative. A comprehensive set of spatial profiles, resolved by harmonic order, validate the technique and reveal the interplay of single-atom and macroscopic effects. (C) 2011 Optical Society of America
引用
收藏
页码：1746 / 1748
页数：3
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