In Situ Monitoring of Growth of Vertically Stacked h-BN/Graphene Heterostructures on Ni Substrates and Their Interface Interaction

被引:2
|
作者
Wei, Wei [1 ,2 ]
Zhang, Guanhua [3 ]
Pan, Jiaqi [1 ]
Cui, Yi [1 ]
Fu, Qiang [2 ]
机构
[1] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Vacuum Interconnected Nanotech Workstn, Suzhou 215123, Peoples R China
[2] Chinese Acad Sci, Dalian Inst Chem Phys, State Key Lab Catalysis, iChEM, Dalian 116023, Peoples R China
[3] Chinese Acad Sci, Dalian Inst Chem Phys, State Key Lab Mol React Dynam, Dalian 116023, Peoples R China
来源
SURFACES | 2020年 / 3卷 / 03期
基金
国家重点研发计划; 中国国家自然科学基金; 中国博士后科学基金;
关键词
hexagonal boron nitride (h-BN); graphene; vertical heterostructures; interface interaction; HEXAGONAL BORON-NITRIDE; GRAPHENE; BN; MICROSCOPY; MONOLAYER; NI(111); FILMS;
D O I
10.3390/surfaces3030024
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Vertically stacked hexagonal boron nitride (h-BN)/graphene heterostructures present potential applications in electronic, photonic, and mechanical devices, and their interface interaction is one of the critical factors that affect the performances. In this work, the vertical h-BN/graphene heterostructures with high coverage are synthesized by chemical vapor deposition (CVD) of h-BN on Ni substrates followed by segregation growth of graphene at the h-BN/Ni interfaces, which are monitored by in situ surface microscopy and surface spectroscopy. We find that h-BN overlayers can be decoupled from Ni substrates by the graphene interlayers. Furthermore, the h-BN domain boundaries exhibit a confinement effect on the graphene interlayer growth and the lower graphene domains are limited within the upper h-BN domains. This work provides new insights into the formation mechanism and interface interaction of the vertical heterostructures.
引用
收藏
页码:328 / 336
页数:9
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