Critical-path-aware X-filling for effective IR-drop reduction in at-speed scan testing

被引：43

作者：

Wen, Xiaoqing ^{[1
]}

Miyase, Kohei ^{[1
]}

Suzuki, Tatsuya ^{[1
]}

Kajihara, Seiji ^{[1
]}

Ohsumi, Yuji

Saluja, Kewal K.

机构：

[1] Kyushu Inst Technol, Dept CSE, Iizuka, Fukuoka 8208502, Japan

来源：

2007 44TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2 | 2007年

关键词：

X-filling; IR-Drop; critical path; test generation; at-speed scan testing; test-induced yield loss;

D O I：

10.1109/DAC.2007.375221

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

IR-drop-induced malfunction is mostly caused by timing violations on activated critical paths during the capture cycle of at-speed scan testing. A critical-path-aware X-filling method is proposed for reducing IR-drop, especially on gates that are close to activated critical paths, thus effectively preventing test-induced yield loss.

引用

页码：527 / +

页数：2

共 23 条

[21] Timing-Accurate Estimation of IR-Drop Impact on Logic-and Clock-Paths During At-Speed Scan Test
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