On Built-In Self-Test for Multipliers

被引：3

作者：

Pulukuri, Mary D. ^{[1
]}

Starr, George J. ^{[1
]}

Stroud, Charles E. ^{[1
]}

机构：

[1] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA

来源：

IEEE SOUTHEASTCON 2010: ENERGIZING OUR FUTURE | 2010年

关键词：

D O I：

10.1109/SECON.2010.5453929

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

We evaluate some of the previously proposed test algorithms and approaches for various types of multipliers. We present methods to effectively test multipliers independent of their architecture and to achieve greater than 99% single stuck-at gate-level fault coverage with a simple 8-bit or 9-bit binary up-counter and some multiplexers. Finally, we discuss testing the multipliers present in most current Field Programmable Gate Arrays (FGPAs). (1)

引用

页码：25 / 28

页数：4

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