Temperature-dependent photoemission spectroscopy study of RExC60 (RE=Yb and Sm) films

被引：3

作者：

He, Shaolong ^{[1
]}

Nakatake, Masashi

Arita, Masashi

Cui, Xiaoyu

Qiao, Shan

Namatame, Hirofumi

Taniguchi, Masaki

Li, Haiyang

Li, Hongnian

机构：

[1] Hiroshima Univ, Hiroshima Synchroton Radiat Ctr, Higashihiroshima 7390046, Japan

[2] Hiroshima Univ, Grad Sch Sci, Higashihiroshima 7398526, Japan

[3] Fudan Univ, Adv Mat Lab, Shanghai 200433, Peoples R China

[4] Zhejiang Univ, Dept Phys, Hangzhou 310027, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 14期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1063/1.2790377

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Temperature-dependent electronic structures of RExC60 (where RE denotes Yb and Sm) films have been studied by high-resolution photoemission spectroscopy (PES). Our results indicate that Yb5C60 is the only metallic phase among all the phases in Yb doped C-60 films. For the Sm fullerides, PES results show that there is no Sm valence transition during the negative thermal expansion in Sm2.75C60 below 32 K. The Sm valence state in Sm2.75C60 films is nearly +2 at room temperature and remains stable in the films down to 16 K. In addition, the negative thermal expansion effect does not result any distinct change in valence-band electronic structures of Sm2.75C60. (c) 2007 American Institute of Physics.

引用

页数：3

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