Surface Defect Detection Methods for Industrial Products: A Review

被引:171
|
作者
Chen, Yajun [1 ,2 ]
Ding, Yuanyuan [1 ]
Zhao, Fan [1 ,2 ]
Zhang, Erhu [1 ,2 ]
Wu, Zhangnan [1 ]
Shao, Linhao [1 ]
机构
[1] Xian Univ Technol, Dept Informat Sci, Xian 710048, Peoples R China
[2] Xian Univ Technol, Shanxi Prov Key Lab Printing & Packaging Engn, Xian 710048, Peoples R China
来源
APPLIED SCIENCES-BASEL | 2021年 / 11卷 / 16期
关键词
industrial products; defect detection; deep learning; unbalanced samples; image dataset; UNSUPERVISED ANOMALY DETECTION; CONVOLUTIONAL NEURAL-NETWORKS; CRACK DETECTION; STEEL STRIP; INSPECTION; CLASSIFICATION; ALGORITHM; DATASET; SYSTEM; CELLS;
D O I
10.3390/app11167657
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The comprehensive intelligent development of the manufacturing industry puts forward new requirements for the quality inspection of industrial products. This paper summarizes the current research status of machine learning methods in surface defect detection, a key part in the quality inspection of industrial products. First, according to the use of surface features, the application of traditional machine vision surface defect detection methods in industrial product surface defect detection is summarized from three aspects: texture features, color features, and shape features. Secondly, the research status of industrial product surface defect detection based on deep learning technology in recent years is discussed from three aspects: supervised method, unsupervised method, and weak supervised method. Then, the common key problems and their solutions in industrial surface defect detection are systematically summarized; the key problems include real-time problem, small sample problem, small target problem, unbalanced sample problem. Lastly, the commonly used datasets of industrial surface defects in recent years are more comprehensively summarized, and the latest research methods on the MVTec AD dataset are compared, so as to provide some reference for the further research and development of industrial surface defect detection technology.
引用
收藏
页数:25
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