A modified histogram approach for accurate self-characterization of analog-to-digital converters

被引：0

作者：

Parthasarathy, KL ^{[1
]}

Jin, L ^{[1
]}

Chen, DG ^{[1
]}

Geiger, R ^{[1
]}

机构：

[1] Iowa State Univ Sci & Technol, Dept Elect & Comp Engn, Ames, IA 50011 USA

来源：

2002 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL II, PROCEEDINGS | 2002年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A new approach for measuring the INL and DNL of an A/D Converter that uses histogram information is introduced. Unlike most existing algorithms, this method does not require the generation of accurate input signals so offers potential for use in a Built-in Self-Test (BIST) environment. Multiple inputs are presented to the device under test and the histograms obtained at the output are analyzed to characterize both the device and the nonlinear input. Preliminary simulation results for a 10-bit flash ADC suggest this approach can measure INL to the 0.5LSB level with a low spectral purity input signal that is linear to less than the 4-bit level.

引用

页码：376 / 379

页数：4

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