Testing reversible one-dimensional QCA Arrays for multiple faults

被引：0
|
作者：
Huang, J. [1 ]
Ma, X. [1 ]
Metra, C. [1 ]
Lombardi, F. [1 ]
机构：
[1] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA
来源：
DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2007年
关键词：
D O I：
10.1109/DFT.2007.17
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Reversible logic design is a well-known paradigm in digital computation. In this paper, Quantum-dot Cellular Automata (QCA) is investigated for testable implementations of reversible logic in array systems. C-testability of a ID array is investigated for multiple cell faults. It has been shown that fault masking is possible in the presence of multiple faults [9]. A technique for achieving C-testability of ID array is introduced by adding lines for controllability and observability. Rules for choosing lines for controllability and observability are proposed. Examples using the QCA reversible logic gates proposed in [9] are presented.
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页码：469 / 477
页数：9
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