Characteristics and microwave dielectric properties of low loss MgZr0.85Sn0.15Nb2O8 ceramics

被引：2
|
作者：
Xiao, Mi [1 ,2 ]
Lou, Jie [1 ,2 ]
Zhang, Ping [1 ,2 ]
机构：
[1] Tianjin Univ, Sch Elect & Informat Engn, Tianjin 300072, Peoples R China
[2] Tianjin Univ, Key Lab Adv Ceram & Machining Technol, Minist Educ, Tianjin 300072, Peoples R China
来源：
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 2018年 / 29卷 / 21期
基金：
中国国家自然科学基金;
关键词：
CRYSTAL-STRUCTURE; LATTICE ENERGY; BOND IONICITY; GLASS; ZN; MG;
D O I：
10.1007/s10854-018-9945-8
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
MgZr0.85Sn0.15Nb2O8 ceramics with wolframite structure were synthesized through traditional solid-state reaction process. X-ray diffraction and scanning electron microscopy were used to analyze the phase and surface morphology. Bond ionicity, lattice energy and bond energy were calculated separately to investigate the correlations with microwave dielectric properties. Typically, optimal microwave dielectric properties were obtained at 1260 degrees C: epsilon(r)=24.91, Qxf=94014GHz, (f)=-43.93ppm/C-o.
引用
收藏
页码：18311 / 18319
页数：9
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