Optical properties and electronic subband structures in InxGa1-xN/GaN multiple quantum wells

被引:5
|
作者
Lee, D. U. [1 ]
Ryu, J. T. [1 ]
You, J. H. [1 ]
Kim, T. W. [1 ]
Jeon, M. H. [2 ,3 ]
Yoo, K. H. [2 ,3 ]
Cho, C. Y. [4 ]
Park, S. J. [4 ]
机构
[1] Hanyang Univ, Dept Elect & Comp Engn, Seoul 133791, South Korea
[2] Kyung Hee Univ, Dept Phys, Seoul 130701, South Korea
[3] Kyung Hee Univ, Inst Basic Sci, Seoul 130701, South Korea
[4] GIST, Dept Mat Sci & Engn, Kwangju 500712, South Korea
关键词
Polarization effect; Electronic structure; InxGa1-xN/GaN multiple quantum well; LIGHT-EMITTING-DIODES; PIEZOELECTRIC POLARIZATION; GAN; ALGAN/GAN; SURFACE; MOVPE;
D O I
10.1016/j.tsf.2011.01.158
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In Ga1-xN/GaN multiple quantum wells (MQWs) were grown on sapphire substrates by using metalorganic chemical vapor deposition. The optical and electrical properties of the MQWs were investigated photoluminescence (PL) and Hall measurements, respectively. The electronic subband energies, the wave functions, and the Fermi energy in the In0.1Ga0.9N/GaN MQWs were calculated by using a multi-band (k) over right arrow . (p) over right arrow theory and considering the strain due to the lattice mismatch and the spontaneous and piezoelectric polarizations. The potential due to free carriers observed in the Hall measurement was also taken into account in solving the Schnidinger equation and the Poisson equation self-consistently. The calculated interband transition energy was compared with the PL data. The calculated electronic structure of the In0.1Ga0.9N/GaN MQWs showed that only one subband below the Fermi level was occupied by the electrons. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:5122 / 5125
页数:4
相关论文
共 50 条
  • [21] Effects of structural defects on optical properties of InxGa1-xN layers and quantum wells
    Liliental-Weber, Z.
    dos Reis, Roberto
    JOURNAL OF APPLIED PHYSICS, 2024, 135 (09)
  • [22] Structural and optical properties of an InxGa1-xN/GaN nanostructure
    Korcak, Sabit
    Ozturk, M. Kemal
    Corekci, Sueleyman
    Akaoglu, Baris
    Yu, Hongbo
    Cakmak, Mehmet
    Saglam, Semran
    Ozcelik, Sueleyman
    Ozbay, Ekmel
    SURFACE SCIENCE, 2007, 601 (18) : 3892 - 3897
  • [23] Micro-photoluminescence study of InxGa1-xN/GaN quantum wells
    Oh, E
    Park, H
    Sone, C
    Nam, O
    Park, Y
    Kim, T
    SOLID STATE COMMUNICATIONS, 2000, 113 (08) : 461 - 464
  • [24] Misfit dislocations and radiative efficiency of InxGa1-xN/GaN quantum wells
    Rebane, YT
    Shreter, YG
    Wang, WN
    APPLIED SURFACE SCIENCE, 2000, 166 (1-4) : 300 - 303
  • [25] Strain relaxation in InxGa1-xN/GaN quantum well structures
    Emara, Ahmed M.
    Berkman, E. Acar
    Zavada, J.
    El-Masry, Nadia A.
    Bedair, S. M.
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 7-8, 2011, 8 (7-8): : 2034 - 2037
  • [26] Luminescence Properties of GaN/InxGa1-xN/InyGa1-yN Double Graded Structures (Zigzag Quantum Wells)
    Sarollahi, Mirsaeid
    Ghosh, Pijush K.
    Aldawsari, Manal A.
    Kuchuk, Andrian
    Ware, Morgan E.
    JOURNAL OF ELECTRONIC MATERIALS, 2020, 49 (06) : 3512 - 3519
  • [27] Time-resolved spectroscopy of InxGa1-xN/GaN multiple quantum wells at room temperature
    Pophristic, M
    Long, FH
    Tran, C
    Karlicek, RF
    Feng, ZC
    Ferguson, IT
    BLUE LASER AND LIGHT EMITTING DIODES II, 1998, : 586 - 587
  • [28] Time-resolved spectroscopy of InxGa1-xN/GaN multiple quantum wells at room temperature
    Pophristic, M
    Long, FH
    Tran, C
    Karlicek, RF
    Feng, ZC
    Ferguson, IT
    APPLIED PHYSICS LETTERS, 1998, 73 (06) : 815 - 817
  • [29] Ultrafast optical characterization of carrier capture times in InxGa1-xN multiple quantum wells
    Özgür, Ü
    Bergmann, MJ
    Casey, HC
    Everitt, HO
    Abare, AC
    Keller, S
    DenBaars, SP
    APPLIED PHYSICS LETTERS, 2000, 77 (01) : 109 - 111
  • [30] Collective effects of interface roughness and alloy disorder in InxGa1-xN/GaN multiple quantum wells
    Zeng, KC
    Smith, M
    Lin, JY
    Jiang, HX
    APPLIED PHYSICS LETTERS, 1998, 73 (12) : 1724 - 1726