共 50 条
- [27] Piezoelectric measurements with atomic force microscopy FERROELECTRIC THIN FILMS VII, 1999, 541 : 617 - 622
- [28] Background-Force Compensation in Dynamic Atomic Force Microscopy PHYSICAL REVIEW APPLIED, 2017, 7 (06):
- [29] Piezoelectric measurements with atomic force microscopy Materials Research Society Symposium - Proceedings, 1999, 541 : 617 - 622