Evolution of dislocation density and character in hot rolled titanium determined by X-ray diffraction

被引：55

作者：

Dragomir, IC

Li, DS

Castello-Branco, GA

Garmestani, H

Snyder, RL

Ribarik, G

Ungar, T

机构：

[1] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA

[2] Florida State Univ, Dept Mech Engn, Tallahassee, FL 32310 USA

[3] CSF RJ, Ctr Fed Educ Tecnol, BR-22710 Rio De Janeiro, Brazil

[4] Eotvos Univ Budapest, Dept Gen Phys, H-1518 Budapest, Hungary

来源：

MATERIALS CHARACTERIZATION | 2005年 / 55卷 / 01期

关键词：

alpha-titanium; X-ray line broadening; dislocations; burgers vector population; texture;

D O I：

10.1016/j.matchar.2005.03.002

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray Peak Profile Analysis was employed to determine the evolution dislocation density and dislocations type in hot rolled commercially pure titanium specimens. It was found that (a) dislocation type is dominating the deformation mechanism at all rolling reduction levels studied here. A good agreement was found between the texture evolution and changes in dislocation slip system activity during the deformation process. (c) 2005 Elsevier Inc. All rights reserved.

引用

页码：66 / 74

页数：9

共 50 条

[41] Density of bunched threading dislocations in epitaxial GaN layers as determined using X-ray diffraction
1600, American Institute of Physics Inc. (123):
[42] Density of bunched threading dislocations in epitaxial GaN layers as determined using X-ray diffraction
Barchuk, M.
Holy, V.
Rafaja, D.
JOURNAL OF APPLIED PHYSICS, 2018, 123 (16)
[43] HOT STAGE FOR X-RAY DIFFRACTION OF CERAMIC SYSTEMS
SEWARD, TP
MOLEA, FN
UHLMANN, DR
REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (12): : 1851 - &
[44] X-RAY DETERMINATION OF DISLOCATION DENSITY IN EPITAXIAL ZNCDTE
QADRI, SB
DINAN, JH
APPLIED PHYSICS LETTERS, 1985, 47 (10) : 1066 - 1068
[45] ANALYSIS OF INTERFACIAL MISFIT DISLOCATION BY X-RAY MULTIPLE DIFFRACTION
MORELHAO, SL
CARDOSO, LP
SOLID STATE COMMUNICATIONS, 1993, 88 (06) : 465 - 469
[46] Modelling of X-ray diffraction images of dislocation loops in crystals
Gevyk, VB
Novikov, SM
Fedortsov, DG
Fodchuk, IM
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2005, 27 (09): : 1237 - 1250
[47] Statistic properties of dislocation structures investigated by X-ray diffraction
Székely, F
Groma, I
Lendvai, J
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2001, 309 : 352 - 355
[48] Dislocation structure and crystallite size distribution in lath martensite determined by X-ray diffraction peak profile analysis
Nedjad, S. Hossein
Movaghar Gharabagh, M.-R.
Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques, 2008, 99 (11): : 1248 - 1255
[49] Dislocation structure and crystallite size distribution in lath martensite determined by X-ray diffraction peak profile analysis
Nedjad, S. Hossein
Gharabagh, M. -R. Movaghar
INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2008, 99 (11) : 1248 - 1255
[50] THE DETERMINATION OF THE TEXTURE OF ROLLED SHEET FROM X-RAY DIFFRACTION PHOTOGRAPHS
DEBARR, AE
ROBERTS, B
JOURNAL OF THE IRON AND STEEL INSTITUTE, 1950, 164 (03): : 285 - 287

← 1 2 3 4 5 →