Deep learning model for imbalanced multi-label surface defect classification

被引:11
|
作者
Liu, Yang [1 ]
Yuan, Yachao [2 ]
Liu, Jing [3 ]
机构
[1] Univ Bremen, D-28359 Bremen, Germany
[2] Univ Goettingen, Inst Comp Sci, D-37077 Gottingen, Germany
[3] Xian Shiyou Univ, Sch Mat Sci & Engn, Key Lab Mat Proc Engn, Xian 710065, Peoples R China
基金
中国国家自然科学基金;
关键词
defect classification; deep learning; imbalanced dataset; multi-label; high accuracy; low latency; IMAGE; IDENTIFICATION;
D O I
10.1088/1361-6501/ac41a6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Automatic defect classification is vital to ensure product quality, especially for steel production. In the real world, the amount of collected samples with labels is limited due to high labor costs, and the gathered dataset is usually imbalanced, making accurate steel defect classification very challenging. In this paper, a novel deep learning model for imbalanced multi-label surface defect classification, named ImDeep, is proposed. It can be deployed easily in steel production lines to identify different defect types on the steel's surface. ImDeep incorporates three key techniques, i.e. Imbalanced Sampler, Fussy-FusionNet, and Transfer Learning. It improves the model's classification performance with multi-label and reduces the model's complexity over small datasets with low latency. The performance of different fusion strategies and three key techniques of ImDeep is verified. Simulation results prove that ImDeep accomplishes better performance than the state-of-the-art over the public dataset with varied sizes. Specifically, ImDeep achieves about 97% accuracy of steel surface defect classification over a small imbalanced dataset with a low latency, which improves about 10% compared with that of the state-of-the-art.
引用
收藏
页数:12
相关论文
共 50 条
  • [31] Multi-label Classification of Big NCDC Weather Data Using Deep Learning Model
    Doreswamy
    Gad, Ibrahim
    Manjunatha, B. R.
    SOFT COMPUTING SYSTEMS, ICSCS 2018, 2018, 837 : 232 - 241
  • [32] Multi-label Patent Classification using Attention-Aware Deep Learning Model
    Roudsari, Arousha Haghighian
    Afshar, Jafar
    Lee, Charles Cheolgi
    Lee, Wookey
    2020 IEEE INTERNATIONAL CONFERENCE ON BIG DATA AND SMART COMPUTING (BIGCOMP 2020), 2020, : 558 - 559
  • [33] Metric Learning for Multi-label Classification
    Brighi, Marco
    Franco, Annalisa
    Maio, Dario
    STRUCTURAL, SYNTACTIC, AND STATISTICAL PATTERN RECOGNITION, S+SSPR 2020, 2021, 12644 : 24 - 33
  • [34] Hyperspherical Learning in Multi-Label Classification
    Ke, Bo
    Zhu, Yunquan
    Li, Mengtian
    Shu, Xiujun
    Qiao, Ruizhi
    Ren, Bo
    COMPUTER VISION, ECCV 2022, PT XXV, 2022, 13685 : 38 - 55
  • [35] Compact learning for multi-label classification
    Lv, Jiaqi
    Wu, Tianran
    Peng, Chenglun
    Liu, Yunpeng
    Xu, Ning
    Geng, Xin
    PATTERN RECOGNITION, 2021, 113
  • [36] On active learning in multi-label classification
    Brinker, K
    FROM DATA AND INFORMATION ANALYSIS TO KNOWLEDGE ENGINEERING, 2006, : 206 - 213
  • [37] Learning multi-label scene classification
    Boutell, MR
    Luo, JB
    Shen, XP
    Brown, CM
    PATTERN RECOGNITION, 2004, 37 (09) : 1757 - 1771
  • [38] Multi-label imbalanced classification based on assessments of cost and value
    Ding, Mengxiao
    Yang, Youlong
    Lan, Zhiqing
    APPLIED INTELLIGENCE, 2018, 48 (10) : 3577 - 3590
  • [39] Multi-label imbalanced classification based on assessments of cost and value
    Mengxiao Ding
    Youlong Yang
    Zhiqing Lan
    Applied Intelligence, 2018, 48 : 3577 - 3590
  • [40] Multi-Label Learning with Deep Forest
    Yang, Liang
    Wu, Xi-Zhu
    Jiang, Yuan
    Zhou, Zhi-Hua
    ECAI 2020: 24TH EUROPEAN CONFERENCE ON ARTIFICIAL INTELLIGENCE, 2020, 325 : 1634 - 1641