Monte Carlo Studies of Hot Electron Transport and High Field Degradation

被引：0
|
作者：
Sun, Ying [1 ]
Boggs, S. A. [1 ,2 ,3 ]
Ramprasad, R. [1 ,2 ,4 ]
机构：
[1] Univ Connecticut, Inst Mat Sci, Storrs, CT 06269 USA
[2] Univ Connecticut, Dept Phys, Storrs, CT 06269 USA
[3] Univ Connecticut, Dept Elect Engn, Storrs, CT 06269 USA
[4] Univ Connecticut, Dept Mat Sci & Engn, Storrs, CT 06269 USA
来源：
2014 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP) | 2014年
关键词：
Electons; Monte Carlo; Breakdown; Degradation; POLYETHYLENE;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The problem of hot electron transport and energy loss at high electric fields in insulators is of considerable interest in the context of dielectric breakdown and hot carrier induced degradation. Hot electron transport is discussed in terms of electron-phonon scattering in polymeric dielectrics. Monte Carlo (MC) simulation provides the basis for study of hot electron transport in thin polyethylene (PE) films. Electron trajectories and spatial evolution of the electron energy distribution are presented. Possible molecular degradation mechanisms are discussed.
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页码：15 / 18
页数：4
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