Spectral effects of dual wavelength low coherence light source in white light interferometry

被引:12
|
作者
Chong, Wee Keat [1 ]
Li, Xiang [1 ]
Soh, Yeng Chai [2 ]
机构
[1] Singapore Inst Mfg Technol, Precis Measurement Grp, Singapore 638075, Singapore
[2] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
关键词
Vertical scanning interferometry; Hybrid light source; LED; Fringe contrast function; Spectral manipulation; FRINGE-PATTERN-ANALYSIS;
D O I
10.1016/j.optlaseng.2012.12.014
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The spectral property of some modern (or hybrid) low coherent light source introduces distinctive feature to the interference signal of white light interferometry. The distinctive feature is defined as discontinuities which make the fringe contrast function (which is the envelope of the interference signal) unable to be modeled as a single Gaussian function. In this paper, we investigate the spectral effect of dual wavelength low coherence light source in white light interferometry and identify the distinctive feature as the result of destructive interference within the localized window where the optical path difference (OPD) is small. By doing so, we give a theoretical explanation of the distinctive feature and demonstrate that the fringe contrast function (and the location of the distinctive feature) can be manipulated by spectrum shaping. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:651 / 655
页数:5
相关论文
共 50 条
  • [31] Optimum wavelength combination in multi-light-source white-light interferometer
    Song, G.J.
    Fang, Z.J.
    Wang, X.Z.
    Guangxue Xuebao/Acta Optica Sinica, 2001, 21 (04): : 463 - 467
  • [32] White light velocity interferometry
    Erskine, DJ
    Holmes, NC
    SHOCK COMPRESSION OF CONDENSED MATTER - 1995, 1996, 370 : 1003 - 1005
  • [33] Dispersive white-light spectral interferometry to measure distances and displacements
    Hlubina, P
    OPTICS COMMUNICATIONS, 2002, 212 (1-3) : 65 - 70
  • [34] White-Light Spectral Interferometry for Characterizing Inhomogeneity in Solutions and Nanocolloids
    Praturi, Aparna
    Schrod, Stefan
    Singh, Bhanu Pratap
    Vasa, Parinda
    ACS NANOSCIENCE AU, 2022, 2 (06): : 486 - 493
  • [35] White-light Spectral Scanning Interferometry for Surface Measurement System
    Wang, Chenchen
    Cao, Nailiang
    Lu, Jin
    Guan, Jiayan
    6TH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION, 2010, 7544
  • [36] Recent developments in fiber optic spectral white-light interferometry
    Jiang Y.
    Ding W.
    Photonic Sensors, 2011, 1 (1) : 62 - 71
  • [37] Refractive index measurements in absorbing media with white light spectral interferometry
    Arosa, Yago
    Lopez Lago, Elena
    de la Fuente, Raul
    OPTICS EXPRESS, 2018, 26 (06): : 7578 - 7586
  • [38] Phase extracting algorithms analysis in the white-light spectral interferometry
    Guo, Tong
    Li, Bingtong
    Li, Minghui
    Chen, Jinping
    Fu, Xing
    Hu, Xiaotang
    2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY - OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS, 2017, 10621
  • [39] Resolution improvement using a dual wavelength white light interferometer
    Wang, DN
    Grattan, KTV
    Palmer, AW
    SENSORS AND ACTUATORS A-PHYSICAL, 1999, 75 (02) : 199 - 203
  • [40] Hybrid Light Source for Scanning White Light Interferometry-based MEMS Quality Control
    Heikkinen, V.
    Hanhijarvi, K.
    Aaltonen, J.
    Raikkonen, H.
    Walchli, B.
    Paulin, T.
    Kassamakov, I.
    Grigoras, K.
    Franssila, S.
    Haeggstrom, E.
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION VII, 2011, 8082