High Resistance Compensation Method for Surface Potential Measurement

被引：0

作者：

Kallay, Nikola ^{[1
]}

Preocanin, Tajana ^{[1
]}

Selmani, Atida ^{[1
]}

Supljika, Filip ^{[1
]}

Lenicek, Ivan ^{[2
]}

机构：

[1] Univ Zagreb, Phys Chem Lab, Dept Chem, Fac Sci, HR-10000 Zagreb, Croatia

[2] Univ Zagreb, Dept Elect Engn Fundamentals & Measurement, Fac Elect Engn & Comp, HR-10000 Zagreb, Croatia

来源：

CROATICA CHEMICA ACTA | 2009年 / 82卷 / 01期

关键词：

single crystal electrode; high resistance compensation; surface potential; rutile; Poggendorff; ELECTROLYTE-SOLUTION; OXIDE; HEMATITE; DEPENDENCE; ADSORPTION; INTERFACE;

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The High Resistance Compensation Method (HRCM) was developed to measure the electrode potentials of high resistance electrodes. It is essentially similar to the classical Poggendorff compensation method, but instead of an ampere-meter, the pH-meter was introduced as an indicator of complete compensation. The method was applied to measurements of the electrode potentials of a single crystal rutile (TiO2) electrode. Electrode potentials were converted to surface potentials, and the dependency of the surface potential on pH in aqueous medium was determined.

引用

页码：323 / 327

页数：5

共 50 条

[31] Compensation Method for Inclination Errors in Measurement Results of Tooth Surface of Spiral Bevel Gear
Liu, Yongsheng
Fang, Suping
Chen, Yixin
Zhang, Jianye
MATHEMATICAL PROBLEMS IN ENGINEERING, 2021, 2021
[32] Measurement investigation of an off-axis aspheric surface via a hybrid compensation method
Li, Shijie
Zhang, Jin
Liu, Weiguo
Guo, Zhongda
Li, Hong
Yang, Zhiqiang
Liu, Bingcai
Tian, Ailing
Li, Xiaoqin
APPLIED OPTICS, 2018, 57 (28) : 8220 - 8227
[33] Measurement method and instrument of thermal contact resistance at high temperature
Xuan Y.
Li Q.
Zhang P.
Zhongguo Kexue Jishu Kexue/Scientia Sinica Technologica, 2019, 49 (05): : 491 - 500
[34] On the measurement of high resistance semiconductors by the van der Pauw method
Morvic, M
ASDAM 2000: THIRD INTERNATIONAL EUROCONFERENCE ON ADVANCED SEMICONDUCTOR DEVICES AND MICROSYSTEMS - CONFERENCE PROCEEDINGS, 2000, : 327 - 330
[35] A ballistic galvanometer method of potentiometric measurement for high resistance cells
Beans, HT
Walden, GH
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1928, 50 : 2673 - 2678
[36] Sensitivity in the measurement of microwave surface resistance of high-Tc superconducting samples of different sizes by the cavity method
Natl Physical Lab, New Delhi, India
Supercond Sci Technol, 1 (48-53):
[37] Measurement method of microwave surface resistance of large area high Tc super-conductive thin films
Zhang, Yingmin
Luo, Zhengxiang
Yang, Kai
Zhang, Qishao
2001, Univ. of Electronic Science and Technology of China (30):
[38] Sensitivity in the measurement of microwave surface resistance of high-Tc superconducting samples of different sizes by the cavity method
Misra, M
Kataria, ND
Srivastava, GP
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1999, 12 (01): : 48 - 53
[39] High Precision Surface Measurement with a Trans-Scale Optical Measurement Method
Cui, Haihua
Liao, Wenhe
Chen, Yinigying
Bian, Xinguang
Cheng, Xiaosheng
Dai, Ning
LIDAR IMAGING DETECTION AND TARGET RECOGNITION 2017, 2017, 10605
[40] Depth measurement of closely spaced surface cracks by the electric potential method
Shkatov, Petr
Lisitsyna, Irina
Sandulyak, Anna
Bulut, Hasan
2ND INTERNATIONAL CONFERENCE ON COMPUTATIONAL MATHEMATICS AND ENGINEERING SCIENCES (CMES2017), 2017, 13

← 1 2 3 4 5 →