Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)

被引：24

作者：

Wang, Feng ^{[1
]}

Egerton, Ray ^{[1
,2
]}

Malac, Marek ^{[1
,2
]}

机构：

[1] Natl Inst Nanotechnol, Edmonton, AB T6G 2M9, Canada

[2] Univ Alberta, Dept Phys, Edmonton, AB T6G 2G7, Canada

来源：

ULTRAMICROSCOPY | 2009年 / 109卷 / 10期

基金：

加拿大自然科学与工程研究理事会;

关键词：

Fourier-ratio deconvolution; Richardson-Lucy (RL) deconvolution; Electron energy-loss spectroscopy (EELS); Plural scattering; Surface plasmon; Bulk plasmon; Interface plasmon; LOSS SPECTRA; RESOLUTION ENHANCEMENT;

D O I：

10.1016/j.ultramic.2009.05.011

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We discuss several ways of using Fourier-ratio deconvolution to process low-loss spectra. They include removal of the tail arising from the zero-loss peak, extraction of the spectrum of a particle from data recorded from the particle on a substrate, separation of the bulk and surface components in spectra recorded from samples of the same composition but different thickness, and investigation of interface energy-loss modes. We also demonstrate the use of a Bayesian-equivalent procedure based on the Richardson-Lucy algorithm. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：1245 / 1249

页数：5

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