Effect of film thickness and biaxial strain on the curie temperature of EuO

被引：23

作者：

Melville, A. ^{[1
]}

Mairoser, T. ^{[2
]}

Schmehl, A. ^{[2
]}

Birol, T. ^{[3
]}

Heeg, T. ^{[4
]}

Hollaender, B. ^{[4
]}

Schubert, J. ^{[4
]}

Fennie, C. J. ^{[3
]}

Schlom, D. G. ^{[1
,5
]}

机构：

[1] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA

[2] Univ Augsburg, Zentrum Elekt Korrelationen & Magnetismus, D-86159 Augsburg, Germany

[3] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14853 USA

[4] Forschungszentrum Julich, JARA FIT, PGI 9 IT, Peter Grunberg Inst, D-52425 Julich, Germany

[5] Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA

来源：

APPLIED PHYSICS LETTERS | 2013年 / 102卷 / 06期

基金：

美国国家科学基金会;

关键词：

EUROPIUM; CRYSTAL; EXCHANGE;

D O I：

10.1063/1.4789972

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The effects of film thickness and epitaxial strain on the magnetic properties of commensurate EuO thin films grown on single crystalline (001) yttria-stabilized zirconia (YSZ) and (110) LuAlO3 substrates are presented. Magnetic measurements show a reduction in the Curie temperature (T-C) for EuO/YSZ films thinner than similar to 10nm. Additionally, the EuO/LuAlO3 films exhibit a systematically lower T-C than the corresponding EuO/YSZ films. This further reduction in TC is attributed to the effect of biaxial tensile strain arising from lattice mismatch: 0.0% for EuO/YSZ and +1.0% for EuO/LuAlO3. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4789972]

引用

页数：5

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