Conductivity of thin metal films at THz frequencies

被引：0
|
作者：
Laman, N. [1 ]
Grischkowsky, D. [1 ]
机构：
[1] Oklahoma State Univ, Sch Elect & Comp Engn, Stillwater, OK 74078 USA
来源：
2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9 | 2008年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The conductivity of thin metal films was measured via their transmission at THz frequencies. The conductivity of all the films, particularly the thinner films and Al films, were much smaller than the bulk DC value. (C) 2008 Optical Society of America
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页码：1592 / 1593
页数：2
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