Thermal conductivity of diamond films:: 0.5 μm to 0.5 μm

被引:0
|
作者
Graebner, JE [1 ]
机构
[1] Lucent Technol, AT&T Bell Labs, Murray Hill, NJ 07974 USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A review of the thermal properties of chemical-vapor-deposited (CVD) diamond ranging in thickness from 0.5 mu m to 0.5 mm is presented. The typical columnar microstructure of the material has a strong influence on the thermal properties, causing a steep gradient in both the in-plane (kappa(parallel to)) and normal (kappa(perpendicular to)) conductivities, as well as considerable anisotropy. Data for kappa(parallel to) from above room temperature down to liquid helium temperatures for high-quality thick samples has revealed several types of phonon scattering centers preferentially located along grain boundaries. This model of dirty grain boundaries provides a framework for understanding the conductivity of thinner, lower-quality material. The general difficulty of identifying microscopic sources of thermal resistance in CVD diamond is discussed, especially in view of the tendency for the concentrations of many types of defects to be highly correlated with each other. Finally, recent work on interfacial resistance between CVD diamond and Si substrate shows that the columnar microstructure has a strong influence for high-quality films as thin as 2 mu m.
引用
收藏
页码:1 / 15
页数:15
相关论文
共 50 条
  • [21] SUPERCONDUCTIVITY IN THIN-FILMS OF THE COMPOSITION M(0.5)CA(0.5)BA(2)CU(3)O(7-DELTA) (M=LU, TB, TH)
    GNANSEKAR, KI
    PINTO, R
    TAMHANE, AS
    PAI, SP
    GUPTA, LC
    SHARON, M
    VIJAYARAGHAVAN, R
    PHYSICA C, 1994, 219 (3-4): : 402 - 406
  • [22] A 0.1-MU-M GATE AL0.5IN0.5AS GA0.5IN0.5AS MODFET FABRICATED ON GAAS SUBSTRATES
    WANG, GW
    CHEN, YK
    SCHAFF, WJ
    EASTMAN, LF
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (07) : 818 - 823
  • [23] Sorption of metal ions on a mixed oxide [0.5 M SiO2 :0.5 M Fe(OH)3]
    Mustafa, S
    Dilara, B
    Naeem, A
    Rahana, N
    Shahida, P
    ADSORPTION SCIENCE & TECHNOLOGY, 2002, 20 (03) : 215 - 230
  • [24] Photophysical and photocatalytic properties of new photocatalysts Caln0.5M0.5O3 (M = Nb, Ta)
    Yin, J
    Zou, ZG
    Ye, JH
    FUNCTIONALLY GRADED MATERIALS VII, 2003, 423-4 : 479 - 483
  • [25] YREE sorption on HFO in 0.5 M NaCl
    Marshall, Kathleen
    Schijf, Johan
    GEOCHIMICA ET COSMOCHIMICA ACTA, 2010, 74 (12) : A670 - A670
  • [26] Passivation of nickel in 0.5 M sulphuric acid
    Gerretsen, J.H.
    De Wit, J.H.W.
    Journal of Applied Electrochemistry, 1991, 21 (03):
  • [27] High-performance 0.5μm transistors
    Inuishi, Masahide
    Mitsubishi Electric Advance, 1988, 44 : 6 - 8
  • [28] A CMOS LC VCO in 0.5μm Process
    Xu, Yin
    Li, Zheying
    2008 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY, VOLS 1-5, 2008, : 1822 - +
  • [29] The endurance performance of 0.5μm FRAM products
    Chu, F
    Davenport, T
    2005 Non-Volatile Memory Technology Symposium, Proceedings, 2005, : 45 - 47
  • [30] Growth of undulating Si0.5Ge0.5 layers for photodetectors at λ = 1.55 μm
    SiGe Microsystems Inc, Ottawa, Canada
    J Appl Phys, 3 (1287-1291):