Reliability of Small Molecule Organic Photovoltaics with Electron-Filtering Compound Buffer Layers

被引:32
|
作者
Burlingame, Quinn [1 ]
Song, Byeongseop [1 ]
Ciammaruchi, Laura [2 ,7 ]
Zanotti, Gloria [2 ,8 ]
Hankett, Jeanne [3 ]
Chen, Zhan [3 ]
Katz, Eugene A. [2 ,4 ]
Forrest, Stephen R. [1 ,5 ,6 ]
机构
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
[2] Ben Gurion Univ Negev, Jacob Blaustein Inst Desert Res, Dept Solar Energy & Environm Phys, IL-84990 Sede Boqer Campus, Israel
[3] Univ Michigan, Dept Chem, Ann Arbor, MI 48109 USA
[4] Ben Gurion Univ Negev, Ilse Katz Inst Nanosci & Technol, IL-84105 Beer Sheva, Israel
[5] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA
[6] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
[7] ICFO Inst Ciencies Foton, Parc Mediterani Technol, Castelldefels 08860, Barcelona, Spain
[8] CNR, Ist Struttura Mat, Via Salaria Km 29,500, I-00015 Monterotondo, Rm, Italy
基金
美国能源部;
关键词
degradation; solar cells; thermal activation; LONG-TERM STABILITY; POLYMER SOLAR-CELLS; BLOCKING LAYER; DEGRADATION; EFFICIENCY; LIFETIME; DEVICES; PARAMETERS;
D O I
10.1002/aenm.201601094
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electron-filtering compound buffer layers (EF-CBLs) improve charge extraction in organic photovoltaic cells (OPVs) by blending an electron-conducting fullerene with a wide energy gap exciton-blocking molecule. It is found that devices with EF-CBLs with high glass transition temperatures and a low crystallization rate produce highly stable morphologies and devices. The most stable OPVs employ 1:1 2,2,2-(1,3,5-benzenetriyl tris-[1-phenyl-1H-benzimidazole] TPBi:C-70 buffers that lose <20% of their initial power conversion efficiency of 6.6 +/- 0.6% after 2700 h under continuous simulated AM1.5G illumination, and show no significant degradation after 100 days of outdoor aging. When exposed to 100-sun (100 kW m(-2)) concentrated solar illumination for 5 h, their power conversion efficiencies decrease by <8%. Moreover, it is found that the reliability of the devices employing stable EF-CBLs has either reduced or no dependence on operating temperature up to 130 degrees C compared with BPhen:C-60 devices whose fill factors show thermally activated degradation. The robustness of TPBi:C-70 devices under extreme aging conditions including outdoor exposure, high temperature, and concentrated illumination is promising for the future of OPV as a stable solar cell technology.
引用
收藏
页数:11
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