共 50 条
- [31] INFLUENCE OF THE DOPANT PROFILE OF AN N+-N-P+ STRUCTURE ON THE CURRENT-VOLTAGE CHARACTERISTIC IN THE BREAKDOWN REGION SOVIET PHYSICS SEMICONDUCTORS-USSR, 1984, 18 (01): : 90 - 92
- [32] S-TYPE CURRENT-VOLTAGE CHARACTERISTIC AND FILAMENTATION OF THE CURRENT IN SILICON N+-N-N+ STRUCTURES WITH DIFFERENT CONTACT AREAS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1983, 17 (08): : 961 - 962
- [33] TEMPERATURE-DEPENDENCE OF CURRENT-VOLTAGE CHARACTERISTICS OF P-I-N GERMANIUM STRUCTURES UNDER DOUBLE INJECTION CONDITIONS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1975, 8 (11): : 1451 - 1452
- [34] INVESTIGATION OF THE REVERSE BRANCH OF THE CURRENT-VOLTAGE CHARACTERISTICS OF HIGH-VOLTAGE P-N STRUCTURES BASED ON GAAS SOVIET PHYSICS SEMICONDUCTORS-USSR, 1984, 18 (11): : 1265 - 1269
- [36] The effect of a thermoelectric field on a current-voltage characteristic of the p-Ge-n-GaAs heterojunction Semiconductors, 2004, 38 : 1302 - 1303
- [40] Current-voltage characteristic and Schottky barrier height of the GaAlAsSb(p)/GaSb(n+) heterostructure PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2001, 183 (02): : 345 - 351