IEEE Journal on Exploratory Solid-State Computational Devices and Circuits-Volume 6, No. 1

被引：0

作者：

Naeemi, Azad ^{[1
]}

机构：

[1] Georgia Inst Technol, Atlanta, GA 30332 USA

来源：

IEEE JOURNAL ON EXPLORATORY SOLID-STATE COMPUTATIONAL DEVICES AND CIRCUITS | 2020年 / 6卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/JXCDC.2020.3002646

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页数：2

共 50 条

[31] MEASUREMENT OF INTERACTION IMPEDANCE OF MICROWAVE CIRCUITS FOR SOLID-STATE DEVICES
YU, SP
YOUNG, JD
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1970, MT18 (11) : 999 - +
[32] A FRESHMAN CLASS IN SOLID-STATE DEVICES AND INTEGRATED-CIRCUITS
RUTLEDGE, D
IEEE TRANSACTIONS ON EDUCATION, 1986, 29 (03) : 136 - 141
[33] FRESHMAN CLASS IN SOLID-STATE DEVICES AND INTEGRATED CIRCUITS.
Rutledge, David
IEEE Transactions on Education, 1986, E-29 (03) : 136 - 141
[34] Thermal analysis of solid-state devices and circuits: an analytical approach
Rinaldi, N
SOLID-STATE ELECTRONICS, 2000, 44 (10) : 1789 - 1798
[35] SOLID-STATE COMPONENT PERFORMANCE SOARS AS DEVICES AND CIRCUITS MATURE
MONCRIEF, FJ
MICROWAVES, 1979, 18 (04): : 19 - 20
[36] JOINT SPECIAL ISSUE ON VLSI ANALOG AND DIGITAL SIGNAL-PROCESSING ALSO PUBLISHED IN IEEE JOURNAL ON SOLID-STATE CIRCUITS, VOLUME SC-21, NUMBER 1 - FOREWORD
LAKER, KR
SEDRA, AS
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1986, 33 (02): : 113 - 115
[37] The electrical origin of the 1/f electrical noise in solid-state devices and integrated circuits - art. no. 65901O
Izpura, Jose-Ignacio
VLSI Circuits and Systems III, 2007, 6590 : O5901 - O5901
[38] Introduction to the Special Issue on the 2013 IEEE International Solid-State Circuits Conference
Malcovati, Piero
Brandt, Brian
Darabi, Hooman
Hashemi, Hossein
Emami, Azita
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2013, 48 (12) : 2947 - 2951
[39] Introduction to the Special Issue on the 2017 IEEE International Solid-State Circuits Conference
Piessens, Tim
Ryu, Seung-Tak
Hung, Chih-Ming
Molnar, Alyosha
Meghelli, Mounir
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2017, 52 (12) : 3115 - 3118
[40] Introduction to the special issue on the 2006 IEEE International Solid-State Circuits Conference
Warnock, James D.
Bidermann, William R.
van der Werf, Albert
Sato, Katsuyuki
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2007, 42 (01) : 3 - 6

← 1 2 3 4 5 →