Effectiveness of Machine Learning in Assessing QoT Impairments of Photonics Integrated Circuits to Reduce System Margin

被引:0
|
作者
Khan, Ihtesham [1 ]
Chalony, Maryvonne [2 ]
Ghillino, Enrico [3 ]
Masood, M. Umar [1 ]
Patel, Jigesh [3 ]
Richards, Dwight [4 ]
Mena, Pablo [3 ]
Bardella, Paolo [1 ]
Carena, Andrea [1 ]
Curri, Vittorio [1 ]
机构
[1] Politecn Torino DET, Turin, Italy
[2] Light Tec SARL, Hyeres, France
[3] Synopsys Inc, New York, NY USA
[4] CUNY Coll Staten Isl, New York, NY USA
关键词
Machine learning; Photonic Integrated Circuits; Q-factor;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose machine learning technique for assessment of QoT impairments of integrated circuits. We consider margin reduction problem applied to a switching component. Overall results and data sets for machine-learning training are obtained by leveraging the integrated software environment of the Synopsys Photonic Design Suite.
引用
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页数:2
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